TY  - JOUR
AU  - Campbell, Jason
AU  - Cheung, Kin
AU  - Suehle, John
C2  - Electron Device Letters
DA  - 2008-09-01
LA  - en
M1  - 29
PB  - Electron Device Letters
PY  - 2008
TI  - New Insight into NBTI Transient Behavior Observed from Fast-GM Measurements
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32968
ER  -