TY  - CONF
AU  - Xiong, Hao
AU  - Heh, Dawei
AU  - Yang, Shuo
AU  - Gurfinkel, Moshe
AU  - Bersuker, Gennadi
AU  - Ioannou, D.
AU  - Richter, Curt
AU  - Cheung, Kin
AU  - Suehle, John
C2  - IEEE International Reliability Physics Symposium Proceedings, Phoenix, AZ
DA  - 2008-04-30
LA  - en
PB  - IEEE International Reliability Physics Symposium Proceedings, Phoenix, AZ
PY  - 2008
TI  - STRESS-INDUCED DEFECT GENERATION IN HFO2/SIO2 STACKS OBSERVED BY USING CHARGE PUMPING AND LOW FREQUENCY NOISE MEASUREMENTS
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32962
ER  -