TY  - JOUR
AU  - Campbell, Jason
AU  - Cheung, Kin
AU  - Suehle, John
AU  - Oates, A
C2  - Applied Physics Letters
DA  - 2008-07-21
LA  - en
PB  - Applied Physics Letters
PY  - 2008
TI  - Negative-Bias Temperature Instability Induced Electron Trapping
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33034
ER  -