TY  - CONF
AU  - Campbell, Jason
AU  - Cheung, Kin
AU  - Suehle, John
AU  - Oates, A
C2  - Proceedings of the 2008 Symposium on VLSI Technology, Honolulu, HI
DA  - 2008-06-17
LA  - en
PB  - Proceedings of the 2008 Symposium on VLSI Technology, Honolulu, HI
PY  - 2008
TI  - Electron Trapping: An Unexpected Mechanism of NBTI and Its Implications
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32983
ER  -