TY  - JOUR
AU  - Richter, Curt
AU  - Xiong, Hao
AU  - Zhu, Xiaoxiao
AU  - Wang, Wenyong
AU  - Stanford, Vincent
AU  - Hong, Woong-Ki
AU  - Lee, Takhee
AU  - Ioannou, D.
AU  - Li, Qiliang
C2  - IEEE Transactions on Electron Devices
DA  - 2008-11-01
LA  - en
M1  - 55
PB  - IEEE Transactions on Electron Devices
PY  - 2008
TI  - Metrology for the Electrical Characterization of Semiconductor Nanowires
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33073
ER  -