TY  - CONF
AU  - Li-Baboud, YaShian
AU  - Simmon, Eric
AU  - Obeng, Yaw
C2  - Symposium on Avoiding, Detecting, and Preventing Counterfeit Electronic Parts, College Park, MD
DA  - 2008-09-10
LA  - en
PB  - Symposium on Avoiding, Detecting, and Preventing Counterfeit Electronic Parts, College Park, MD
PY  - 2008
TI  - Identity management standards for product life cycle of electronic parts
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33159
ER  -