TY  - JOUR
AU  - Zhang, Nien
AU  - Sedransk, N
AU  - Jarrett, Dean
C2  - IEEE Transactions on Instrumentation and Measurement
DA  - 2003-04-01
LA  - en
M1  - 52
PB  - IEEE Transactions on Instrumentation and Measurement
PY  - 2003
TI  - Statistical Uncertainty Analysis of Key Comparison CCEM-K2
ER  -