TY  - JOUR
AU  - Tang, Xiao
AU  - Zheng, Jian
C2  - Optical Engineering
DA  - 2002-12-01
LA  - en
M1  - 41
PB  - Optical Engineering
PY  - 2002
TI  - High Precision Measurement of Reflectance for Films Under Substrates
ER  -