TY  - JOUR
AU  - McMichael, Robert
AU  - Stiles, Mark
AU  - Chen, P
AU  - Egelhoff, William
C2  - Journal of Applied Physics
DA  - 1998-06-01
LA  - en
M1  - 83
PB  - Journal of Applied Physics
PY  - 1998
TI  - Ferromagnetic Resonance Linewidth in Thin Films Coupled to NiO
ER  -