TY  - CONF
AU  - Marks, Roger
AU  - Jargon, Jeffrey
AU  - Rytting, D.
C2  - Tech. Dig.,   IEEE MTT-S International Microwave Symposium, Baltimore, MD
DA  - 1998-06-01
DO  - https://doi.org/10.1109/MWSYM.1998.700656
LA  - en
M1  - 3
PB  - Tech. Dig.,   IEEE MTT-S International Microwave Symposium, Baltimore, MD
PY  - 1998
TI  - Accuracy of Lumped-Element Calibrations for Four-Sampler Vector Network Analyzers
ER  -