TY  - CONF
AU  - Armstrong, Nicholas
AU  - Dowd, A
AU  - Cline, James
AU  - Kalceff, W
C2  - 52nd Denver X-ray Conference , Steamboat Springs CO, 
DA  - 2005-01-08
LA  - en
PB  - 52nd Denver X-ray Conference , Steamboat Springs CO, 
PY  - 2005
TI  - Bayesian Analysis of Ceria Nanoparticles from Line Profile Data
ER  -