TY  - VIDEO
AU  - Wang, W
AU  - Lee, S
AU  - Chuang, Tze
C2  - Steady-State Crack Growth Along a Grain Boundary in Interconnects With a High Electric Field Intensity
DA  - 2002-03-01
LA  - en
M1  - 82
PB  - Steady-State Crack Growth Along a Grain Boundary in Interconnects With a High Electric Field Intensity
PY  - 2002
TI  - Steady-State Crack Growth Along a Grain Boundary in Interconnects With a High Electric Field Intensity
ER  -