TY  - JOUR
AU  - Black, David
AU  - Woicik, Joseph
AU  - Erdtmann, M
AU  - Currie, M
C2  - Applied Physics Letters
DA  - 2006-05-29
LA  - en
M1  - 88
PB  - Applied Physics Letters
PY  - 2006
TI  - Imaging Defects in Strained Silicon Thin Films by X-ray Topography
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=854299
ER  -