TY  - GEN
AU  - Obrzut, Jan
AU  - Chiang, C.
AU  - Popielarz, R
AU  - Nozaki, R
C2  - NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2000-01-01
DO  - https://doi.org/10.6028/NIST.IR.6537
LA  - en
M1  - 73(5)
PB  - NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2000
TI  - Evaluation of Dielectric Properties of Polymer Thin-Films Materials for Application in Embedded Capacitance
ER  -