TY  - CONF
AU  - Duewer, David
AU  - Ellison, S
AU  - Guthrie, William
AU  - Hibbert, D
AU  - Jackson, C
AU  - Kallner, A
AU  - Leigh, Stefan
AU  - Parris, Reenie
AU  - Pratt, Kenneth
AU  - Schantz, Michele
AU  - Sharpless, Katherine
C2  - Metrology, Reliable Measurements for the Development of Mexico Symposium 2006 |   | Symposium of Metrology | Centro Nacional de Metrolog a, Quer taro, -1
DA  - 2006-04-24
LA  - en
PB  - Metrology, Reliable Measurements for the Development of Mexico Symposium 2006 |   | Symposium of Metrology | Centro Nacional de Metrolog a, Quer taro, -1
PY  - 2006
TI  - k=2 and Other Sometimes Hidden Assumptions in Chemical Measurement Uncertainty Intervals
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=832153
ER  -