TY  - CONF
AU  - Yoon, Howard
AU  - Davies, Matthew
AU  - Burns, Timothy
AU  - Kennedy, Michael
C2  - Thermosense XXII | XXII | | Marcel Dekker Inc.
DA  - 2000-08-01
LA  - en
M1  - 4020
PB  - Thermosense XXII | XXII | | Marcel Dekker Inc.
PY  - 2000
TI  - Calibrated Thermal Microscopy of the Tool-Chip Interface in Machining
ER  -