TY  - JOUR
AU  - Powell, Cedric
AU  - Jablonski, Aleksander
AU  - Werner, W
AU  - Smekal, W
C2  - Applied Surface Science
DA  - 2005-04-01
LA  - en
M1  - 239
PB  - Applied Surface Science
PY  - 2005
TI  - Characterization of Thin Films on the Nanometer Scale by Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
ER  -