TY  - CONF
AU  - Shrestha, Pragya
AU  - Cheung, Kin
AU  - Ryan, Jason
AU  - Campbell, Jason
AU  - Baumgart, Helmut
C2  - 2012 IEEE International Integrated Reliability Workshop Final Report, Fallen Leaf Lake, CA
DA  - 2014-03-03
LA  - en
PB  - 2012 IEEE International Integrated Reliability Workshop Final Report, Fallen Leaf Lake, CA
PY  - 2014
TI  - Fast-Capacitance for Advanced Device Characterization
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=914753
ER  -