TY  - CONF
AU  - Chbili, Zakariae
AU  - Cheung, Kin
AU  - Campbell, Jason
AU  - Suehle, John
AU  - Ioannou, D.
AU  - Lelis, Aivars
AU  - Ryu, Sei-Hyung
C2  - International Integrated Reliability Workshop Final Report, Stanford Sierra Camp, CA
DA  - 2014-03-03
LA  - en
PB  - International Integrated Reliability Workshop Final Report, Stanford Sierra Camp, CA
PY  - 2014
TI  - Unusual Bias Temperature Instability in SiC DMOSFET
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=914921
ER  -