TY  - GEN
AU  - Lee, Yung-Tsun
C2  - NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1990-01-01
DO  - https://doi.org/10.6028/NIST.IR.4358
LA  - en
PB  - NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1990
TI  - On Extending the Standard for the Exchange of Product Data to Represent Two-Dimensional Apparel Pattern Pieces
ER  -