TY  - CONF
AU  - Schafft, Harry
C2  - 1998 IEEE International Integrated Reliability Workshop Final Report, Lake Tahoe, CA
DA  - 1999-12-31
LA  - en
PB  - 1998 IEEE International Integrated Reliability Workshop Final Report, Lake Tahoe, CA
PY  - 1999
TI  - Interconnect Reliability Test Chip NIST 36: For Development of Measurement Tools & Standards
ER  -