TY  - CONF
AU  - Blackburn, David
C2  - Proceedings of the 20th IEEE Semiconductor Temperature Measurement and Management Symposium, San Jose, CA
DA  - 2004-03-10
LA  - en
PB  - Proceedings of the 20th IEEE Semiconductor Temperature Measurement and Management Symposium, San Jose, CA
PY  - 2004
TI  - Temperature Measurements of Semiconductor Devices-A Review
ER  -