TY  - CONF
AU  - Postek, Michael
C2  - Proc., 45th Annual Meeting, Electron Microscope Society of America, Boston, MA
DA  - 1987-12-31
LA  - en
PB  - Proc., 45th Annual Meeting, Electron Microscope Society of America, Boston, MA
PY  - 1987
TI  - Resolution and Measurement in the Scanning Electron Microscope
ER  -