TY  - CONF
AU  - Young, M.
C2  - Proc. Intl. Soc. for Optical Engineering (SPIE)
DA  - 1983-03-01
LA  - en
M1  - 362
PB  - Proc. Intl. Soc. for Optical Engineering (SPIE)
PY  - 1983
TI  - Objective measurement and characterization of scratch standards
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=12626
ER  -