TY  - JOUR
AU  - Jurchescu, Oana
AU  - Hamadani, Behrang
AU  - Xiong, Hao
AU  - Park, Sungkyu
AU  - Subramanian, Sankar
AU  - Zimmerman, Neil
AU  - Anthony, John
AU  - Jackson, Thomas
AU  - Gundlach, David
C2  - Applied Physics Letters
DA  - 2008-03-31
DO  - https://doi.org/10.1063/1.2903508
LA  - en
M1  - 92
PB  - Applied Physics Letters
PY  - 2008
TI  - Correlation Between Microstructure, Electronic Properties and Ficker Noise in Organic Thin Film Transistors
ER  -