TY  - JOUR
AU  - Postek, Michael
C2  - Scanning Microscopy
DA  - 1989-12-31
LA  - en
M1  - 3
PB  - Scanning Microscopy
PY  - 1989
TI  - Scanning Electron Microscope-Based Metrological Electron Microscope System and New Prototype SEM Magnification Standard
ER  -