TY  - JOUR
AU  - Zimmerman, Neil
AU  - Fujiwara, Akira
AU  - Inokawa, Hiroshi
AU  - Takahashi, Yasuo
C2  - Applied Physics Letters
DA  - 2006-08-10
DO  - https://doi.org/10.1063/1.2240600
LA  - en
M1  - 89
PB  - Applied Physics Letters
PY  - 2006
TI  - Electrostatically gated Si devices: Coulomb blockade and barrier capacitance
ER  -