TY  - CONF
AU  - Richter, Curt
AU  - Xiong, Hao
AU  - Zhu, Xiaoxiao
AU  - Wang, Wenyong
AU  - Stanford, Vincent
AU  - Li, Qiliang
AU  - Ioannou, D.
AU  - Hong, Woong-Ki
AU  - Lee, Takhee
C2  - Proceedings of the 46th Annual IEEE Reliability Physics Symposium 2008, Phoenix, AZ
DA  - 2008-04-30
LA  - en
PB  - Proceedings of the 46th Annual IEEE Reliability Physics Symposium 2008, Phoenix, AZ
PY  - 2008
TI  - Measurements for the Reliability and Electrical Characterization of Semiconductor Nanowires
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32971
ER  -