TY  - GEN
AU  - McCrackin, F
AU  - Passaglia, E
AU  - Stromberg, R
AU  - Steinberg, H
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2001-05-01
LA  - en
M1  - 106 No. 3
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2001
TI  - Treasure of the Past VII: Measurement of the Thickness and Refractive Index of Very Thin Films and the Optical Properties of Surfaces by Ellipsometry
ER  -