TY  - CONF
AU  - Fitting, D
AU  - Dube, W
AU  - Siewert, Thomas
C2  - Nondestructive Characterization of Materials, International Symposium | 8th | |
DA  - 1998-06-01
LA  - en
M1  - 8
PB  - Nondestructive Characterization of Materials, International Symposium | 8th | |
PY  - 1998
TI  - High Energy X-Ray Diffraction Technique for Monitoring Solidification of Single Crystal Castings
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=851224
ER  -