TY  - JOUR
AU  - Stambaugh, Corey
AU  - Kemiktarak, Utku
AU  - Durand, Mathieu
AU  - Lawall, John
C2  - Applied Optics
DA  - 2014-07-23
DO  - https://doi.org/10.1364/AO.53.004930
LA  - en
PB  - Applied Optics
PY  - 2014
TI  - Cavity-enhanced measurements for determining dielectric membrane thickness and complex index of refraction
ER  -