TY  - CONF
AU  - Kim, Kichul
AU  - Wallis, Thomas
AU  - Rice, Paul
AU  - Chiang, Chin
AU  - Imtiaz, Atif
AU  - Kabos, Pavel
AU  - Zhang, Jintao
C2  - IEEE MTT-S  International Microwave Symposium , Anaheim, CA
DA  - 2010-05-23
DO  - https://doi.org/10.1109/MWSYM.2010.5518053
LA  - en
PB  - IEEE MTT-S  International Microwave Symposium , Anaheim, CA
PY  - 2010
TI  - Modeling and metrology of metallic nanowires with application to microwave interconnects
ER  -