TY  - JOUR
AU  - Gu, Dazhen
AU  - Wallis, Thomas
AU  - Kabos, Pavel
AU  - Blanchard, Paul
AU  - Bertness, Kristine
AU  - Sanford, Norman
C2  - Journal of Applied Physics
DA  - 2012-08-24
DO  - https://doi.org/10.1088/0957-0233/23/10/105602
LA  - en
M1  - 23
PB  - Journal of Applied Physics
PY  - 2012
TI  - Microwave Measurements and Systematic Circuit-Model Extraction of Nanowire Metal Semiconductor Field Effect Transistors
ER  -