TY  - CONF
AU  - Sanders, Aric
AU  - Fox, Anna
AU  - Dresselhaus, Paul
AU  - Curtin, Alexandra
C2  - Microscopy and Microanyalsis, Hartford, CT
DA  - 2014-08-27
DO  - https://doi.org/10.1017/S1431927614005583
LA  - en
M1  - 20
PB  - Microscopy and Microanyalsis, Hartford, CT
PY  - 2014
TI  - Optimization of Focused Ion Beam-Tomography for Superconducting Electronics
ER  -