TY  - JOUR
AU  - Xu, Kun
AU  - Kirillov, Oleg
AU  - Gundlach, David
AU  - Nguyen, Nhan
AU  - Ye, Pei
AU  - Xu, Min
AU  - Dong, Lin
AU  - Sio, Hong
C2  - Journal of Applied Physics
DA  - 2013-01-09
DO  - https://doi.org/10.1063/1.4774038
LA  - en
M1  - 113
PB  - Journal of Applied Physics
PY  - 2013
TI  - Band Offset Determination of Atomic-Layer-Deposited Al2O3 and HfO2 on InP by Internal Photoemission and Spectroscopic Ellipsometry
ER  -