TY  - CHAP
AU  - Read, David
AU  - Gerstle, Walter
AU  - Tewary, Vinod
C2  - Electromigration in Thin Films and Electronic Devices: Materials and Reliability, Woodhead Publishing Limited, Cambridge, -1
DA  - 2011-08-28
LA  - en
PB  - Electromigration in Thin Films and Electronic Devices: Materials and Reliability, Woodhead Publishing Limited, Cambridge, -1
PY  - 2011
TI  - Modeling electromigration using the peridynamics approach
ER  -