TY  - JOUR
AU  - Francis, Michael
C2  - IEEE Circuits & Devices
DA  - 2012-07-08
DO  - https://doi.org/10.1109/APS.2012.6348884
LA  - en
PB  - IEEE Circuits & Devices
PY  - 2012
TI  - Estimating Far-Field Errors Due to Mechanical Errors in Spherical Near-Field Scanning
ER  -