TY  - JOUR
AU  - Wallis, Thomas
AU  - Pierantoni, Luca
C2  - IEEE Microwave Magazine
DA  - 2014-01-20
DO  - https://doi.org/10.1109/MMM.2013.2292758
LA  - en
M1  - 15
PB  - IEEE Microwave Magazine
PY  - 2014
TI  - Measurement Techniques for RF Nanoelectronics
ER  -