TY  - JOUR
AU  - Booth, James
AU  - Orloff, Nathan
AU  - Cagnon, Joel
AU  - Lu, Jiwei
AU  - Stemmer, Susanne
C2  - Applied Physics Letters
DA  - 2010-07-12
DO  - https://doi.org/10.1063/1.3455897
LA  - en
PB  - Applied Physics Letters
PY  - 2010
TI  - Temperature-dependent dielectric relaxation in bismuch zinc niobate thin films.
ER  -