TY  - CONF
AU  - Keller, Robert
AU  - Strus, Mark
AU  - Chiaramonti, Ann
AU  - Read, David
AU  - Kim, Younglae
AU  - Jung, Yung
C2  - AIP Conference Proceedings (volume TBD), Woodbury, NY
DA  - 2011-11-10
DO  - https://doi.org/10.1063/1.3657900
LA  - en
PB  - AIP Conference Proceedings (volume TBD), Woodbury, NY
PY  - 2011
TI  - Reliability Testing of Advanced Interconnect Materials
ER  -