TY  - JOUR
AU  - Kraft, Marlin
AU  - Elmquist, Randolph
AU  - Rietveld, Gert
AU  - van, Jan
AU  - Mortara, Alessandro
AU  - Jeckelmann, Beat
C2  - IEEE Transactions on Instrumentation and Measurement
DA  - 2016-03-01
LA  - en
M1  - 62
PB  - IEEE Transactions on Instrumentation and Measurement
PY  - 2016
TI  - Low-Ohmic Resistance Comparison: Measurement Capabilities and Resistor Traveling Behavior
ER  -