TY  - JOUR
AU  - Vaudin, Mark
AU  - Osborn, William
AU  - Friedman, Lawrence
AU  - Gorham, Justin
AU  - Cook, Robert
AU  - Vartanian, Victor
C2  - Ultramicroscopy
DA  - 2015-01-01
DO  - https://doi.org/10.1016/j.ultramic.2014.09.007
LA  - en
M1  - 148
PB  - Ultramicroscopy
PY  - 2015
TI  - Designing a standard for strain mapping: HR-EBSD analysis of SiGe thin film structures on Si
ER  -