TY  - CONF
AU  - Keller, Robert
AU  - Read, David
AU  - Shaviv, Roey
AU  - Harm, Greg
AU  - Kumari, Sangita
C2  - 2011 IEEE International Reliability Physics Symposium, Monterey, CA
DA  - 2011-04-10
DO  - https://doi.org/10.1109/IRPS.2011.5784570
LA  - en
PB  - 2011 IEEE International Reliability Physics Symposium, Monterey, CA
PY  - 2011
TI  - Electromigration of Cu Interconnects Under AC, Pulsed-DC and DC Test Conditions - Ramifications on Accelerated Testing
ER  -