TY  - JOUR
AU  - Obeng, Yaw
AU  - Okoro, Chukwudi
AU  - Amoah, Papa
AU  - Vartanian, Victor
C2  - ECS Journal of Solid State Science and Technology
DA  - 2016-08-18
DO  - https://doi.org/10.1149/2.0411609jss
LA  - en
M1  - 5
PB  - ECS Journal of Solid State Science and Technology
PY  - 2016
TI  - Towards Understanding Early Failures Behavior during Device Burn-In: Broadband RF Monitoring of Atomistic Changes in Materials
ER  -