TY  - CHAP
AU  - Ryan, Jason
AU  - Campbell, Jason
AU  - Suehle, John
AU  - Cheung, Kin
C2  - Characterization and Metrology for Nanoelectronics and Nanostructures, Pan Stanford Publishing, Boca Raton, FL
DA  - 2016-09-14
LA  - en
PB  - Characterization and Metrology for Nanoelectronics and Nanostructures, Pan Stanford Publishing, Boca Raton, FL
PY  - 2016
TI  - Charge Pumping for Reliability Characterization and Testing of Nanoelectronic Devices
ER  -