TY  - JOUR
AU  - Martin, Joshua
AU  - Wong-Ng, Winnie
AU  - Green, Martin
C2  - Journal of Electronic Materials
DA  - 2015-01-29
DO  - https://doi.org/10.1007/s11664-015-3640-9
LA  - en
M1  - 44
PB  - Journal of Electronic Materials
PY  - 2015
TI  - Seebeck Coefficient Metrology: Do Contemporary Protocols Measure Up?
ER  -