TY  - CONF
AU  - Hagmann, Joseph
AU  - Wang, Xiqiao
AU  - Namboodiri, Pradeep
AU  - Wyrick, Jonathan
AU  - Murray, Roy
AU  - Stewart, Michael
AU  - Silver, Richard
AU  - Richter, Curt
C2  - 59th Electronic Materials Conference, Notre Dame, IN
DA  - 2017-06-29
LA  - en
PB  - 59th Electronic Materials Conference, Notre Dame, IN
PY  - 2017
TI  - Towards single atom devices for quantum information and metrology: weak localization in embedded phosphorus delta layers in silicon
ER  -