TY  - JOUR
AU  - Yu, Liangchun
AU  - Dunne, Greg
AU  - Matocha, Kevin
AU  - Cheung, Kin
AU  - Suehle, John
AU  - Sheng, Kuang
C2  - IEEE Transactions on Device and Materials Reliability
DA  - 2010-09-20
LA  - en
PB  - IEEE Transactions on Device and Materials Reliability
PY  - 2010
TI  - Reliability Issues of SiC MOSFETs: A Technology for High Temperature Environments
ER  -