TY  - CONF
AU  - Yu, Liangchun
AU  - Cheung, Kin
AU  - Dunne, Greg
AU  - Matocha, Kevin
AU  - Suehle, John
AU  - Sheng, Kuang
C2  - Silicon Carbide and Related Materials 2009, Nuremberg, -1
DA  - 2009-10-11
LA  - en
PB  - Silicon Carbide and Related Materials 2009, Nuremberg, -1
PY  - 2009
TI  - Gate Oxide Long-Term Reliability of 4H-SiC MOS Devices
ER  -