TY  - JOUR
AU  - Holloway, Christopher
AU  - Simons, Matthew
AU  - Gordon, Joshua
AU  - Raithel, Georg
AU  - Anderson, dave
C2  - Journal of Applied Physics
DA  - 2017-05-24
LA  - en
PB  - Journal of Applied Physics
PY  - 2017
TI  - Electric field metrology for SI traceability: Systematic measurement uncertainties in electromagnetically induced transparency in atomic vapor
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=923077
ER  -